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90314020 (01/1995-12/1995) Optical instruments and appliances for inspecting photomasks for semiconductor devices

Source: Eurostat, Luxembourg

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	Series	Description	Direct Link
	[cn90314010.000EP0001]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: France / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A
	[cn90314010.000EP0002]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: Belgium/ Luxembourg / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A
	[cn90314010.000EP0003]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: Netherlands / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A
	[cn90314010.000EP0004]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: Germany / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A
	[cn90314010.000EP0005]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: Italy / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A
	[cn90314010.000EP0006]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: United Kingdom / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A
	[cn90314010.000EP0009]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: Greece / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A
	[cn90314010.000EP0010]	CN 90314010 / Exports / Unit = Prices (Euro/ ton) / Partner: Portugal / Reporter: Eur27 /90314010:Optical Instruments and Appliances for Automatically Inspecting Patterns on Masks or Reticles for Semiconductor Devices	A