Source: Eurostat, Luxembourg
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: France / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Belgium/ Luxembourg / Reporter: Eur27 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Netherlands / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Germany / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Italy / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: United Kingdom / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Ireland / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Denmark / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Greece / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Portugal / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Spain / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Belgium / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Luxembourg / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Iceland / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Norway / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Sweden / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Finland / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Liechtenstein / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Austria / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Switzerland / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Faroe Isles / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Gibraltar / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Malta / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Turkey / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Estonia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Latvia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Lithuania / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Poland / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Czech Rep. / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Slovakia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Hungary / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Romania / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Bulgaria / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Albania / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Ukraine / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Belarus / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Moldova / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Russia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Georgia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Armenia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Azerbaijan / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Kasakhstan / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Turkmenistan / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Uzbekistan / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Kyrghistan / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Slovenia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Croatia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Bosnia-herz. / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Serb.monten. / Reporter: Eur15 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Kosovo / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: For.jrep.mac / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Montenegro / Reporter: Eur28 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Serbia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Morocco / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Algeria / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Tunisia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Libya / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Egypt / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Sudan / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Mauritania / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Mali / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Niger / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Chad / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Cape Verde / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Senegal / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Gambia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Guinea / Reporter: Eur27 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Sierra Leone / Reporter: Eur15 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Liberia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Ivory Coast / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Ghana / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Togo / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Nigeria / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Cameroon / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Centr.africa / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Equat.guinea / Reporter: Eur25 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Gabon / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Congo / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Congo (Dem. Rep.) / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Rwanda / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Angola / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Ethiopia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Eritrea / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Kenya / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Uganda / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Tanzania / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Mozambique / Reporter: Eur28 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Madagascar / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Zambia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Zimbabwe / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Malawi / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: South Africa / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Namibia / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Usa / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Canada / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Greenland / Reporter: Eur15 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Mexico / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Guatemala / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Belize / Reporter: Eur27 /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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CN 90319020 / Exports / Unit = Prices (Euro/ ton) / Partner: Honduras / Reporter: European Union /90319020:Parts and Accessories for Optical Instruments and Appliances for Inspecting Semiconductor Wafers or Devices or for Inspecting Photomasks or Reticles Used in Manufacturing Semiconductor Devices or for Measuring Surface Particulate Contamination on Semiconductor Wafers, N.e.s. |
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